Low Energy Electron Diffraction Analysis of Ultrathin Ag Films on W(110).

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Title: Low Energy Electron Diffraction Analysis of Ultrathin Ag Films on W(110).
Authors: Poon, H. C.1, Tong, S. Y.1, Chung, W. F.2, Altman, M. S.2
Source: Surface Review & Letters; Dec1998, Vol. 5 Issue 6, p1143-1149, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 126702162
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Low Energy Electron Diffraction Analysis of Ultrathin Ag Films on W(110).
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  Data: <searchLink fieldCode="AU" term="%22Poon%2C+H%2E+C%2E%22">Poon, H. C.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Tong%2C+S%2E+Y%2E%22">Tong, S. Y.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Chung%2C+W%2E+F%2E%22">Chung, W. F.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Altman%2C+M%2E+S%2E%22">Altman, M. S.</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Surface+Review+%26+Letters%22">Surface Review & Letters</searchLink>; Dec1998, Vol. 5 Issue 6, p1143-1149, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=126702162
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1142/S0218625X9800147X
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 7
        StartPage: 1143
    Titles:
      – TitleFull: Low Energy Electron Diffraction Analysis of Ultrathin Ag Films on W(110).
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            NameFull: Poon, H. C.
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            NameFull: Tong, S. Y.
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            NameFull: Chung, W. F.
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            NameFull: Altman, M. S.
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            – D: 01
              M: 12
              Text: Dec1998
              Type: published
              Y: 1998
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              Value: 5
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              Value: 6
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            – TitleFull: Surface Review & Letters
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