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Computing reliability: On the differences between software testing and software fault injection techniques.

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Title: Computing reliability: On the differences between software testing and software fault injection techniques.
Authors: Kooli, Maha1, maha.kooli@lirmm.fr, Kaddachi, Firas1, firas.kaddachi@lirmm.fr, Natale, Giorgio Di1, giorgiodi.natale@lirmm.fr, Bosio, Alberto1, alberto.bosio@lirmm.fr, Benoit, Pascal1, pascal.benoit@lirmm.fr, Torres, Lionel1, lionel.torres@lirmm.fr
Source: Microprocessors & Microsystems; May2017, Vol. 50, p102-112, 11p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 126804807
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Computing reliability: On the differences between software testing and software fault injection techniques.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Kooli%2C+Maha%22">Kooli, Maha</searchLink><relatesTo>1</relatesTo>, <i>maha.kooli@lirmm.fr</i><br /><searchLink fieldCode="AU" term="%22Kaddachi%2C+Firas%22">Kaddachi, Firas</searchLink><relatesTo>1</relatesTo>, <i>firas.kaddachi@lirmm.fr</i><br /><searchLink fieldCode="AU" term="%22Natale%2C+Giorgio+Di%22">Natale, Giorgio Di</searchLink><relatesTo>1</relatesTo>, <i>giorgiodi.natale@lirmm.fr</i><br /><searchLink fieldCode="AU" term="%22Bosio%2C+Alberto%22">Bosio, Alberto</searchLink><relatesTo>1</relatesTo>, <i>alberto.bosio@lirmm.fr</i><br /><searchLink fieldCode="AU" term="%22Benoit%2C+Pascal%22">Benoit, Pascal</searchLink><relatesTo>1</relatesTo>, <i>pascal.benoit@lirmm.fr</i><br /><searchLink fieldCode="AU" term="%22Torres%2C+Lionel%22">Torres, Lionel</searchLink><relatesTo>1</relatesTo>, <i>lionel.torres@lirmm.fr</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Microprocessors+%26+Microsystems%22">Microprocessors & Microsystems</searchLink>; May2017, Vol. 50, p102-112, 11p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=126804807
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.micpro.2017.02.007
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 11
        StartPage: 102
    Titles:
      – TitleFull: Computing reliability: On the differences between software testing and software fault injection techniques.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Kooli, Maha
      – PersonEntity:
          Name:
            NameFull: Kaddachi, Firas
      – PersonEntity:
          Name:
            NameFull: Natale, Giorgio Di
      – PersonEntity:
          Name:
            NameFull: Bosio, Alberto
      – PersonEntity:
          Name:
            NameFull: Benoit, Pascal
      – PersonEntity:
          Name:
            NameFull: Torres, Lionel
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 05
              Text: May2017
              Type: published
              Y: 2017
          Identifiers:
            – Type: issn-print
              Value: 01419331
          Numbering:
            – Type: volume
              Value: 50
          Titles:
            – TitleFull: Microprocessors & Microsystems
              Type: main
ResultId 1