Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability.
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| Title: | Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability. |
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| Authors: | Mukhopadhyay, Subhadeep1, smukhopa@tsmc.com, Lee, Yung-Huei1, Lee, Jen-Hao1 |
| Source: | Microelectronics Reliability; Feb2018, Vol. 81, p226-231, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00262714 |
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| DOI: | 10.1016/j.microrel.2017.12.044 |
