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Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability.

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Title: Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability.
Authors: Mukhopadhyay, Subhadeep1, smukhopa@tsmc.com, Lee, Yung-Huei1, Lee, Jen-Hao1
Source: Microelectronics Reliability; Feb2018, Vol. 81, p226-231, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 127843725
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1016/j.microrel.2017.12.044
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 226
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      – TitleFull: Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability.
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            NameFull: Mukhopadhyay, Subhadeep
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            NameFull: Lee, Yung-Huei
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              Text: Feb2018
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              Y: 2018
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              Value: 81
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