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Assessing Ink Transfer Performance of Gravure-Offset Fine-Line Circuitry Printing.

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Title: Assessing Ink Transfer Performance of Gravure-Offset Fine-Line Circuitry Printing.
Authors: Cheng, Hsien-Chie1, hccheng@fcu.edu.tw, Chen, You-Wei2, Chen, Wen-Hwa2, whchen@pme.nthu.edu.tw, Lu, Su-Tsai3, Lin, Shih-Ming3
Source: Journal of Electronic Materials; Mar2018, Vol. 47 Issue 3, p1832-1846, 15p, 5 Diagrams, 10 Graphs
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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  Data: <searchLink fieldCode="AU" term="%22Cheng%2C+Hsien-Chie%22">Cheng, Hsien-Chie</searchLink><relatesTo>1</relatesTo>, <i>hccheng@fcu.edu.tw</i><br /><searchLink fieldCode="AU" term="%22Chen%2C+You-Wei%22">Chen, You-Wei</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Chen%2C+Wen-Hwa%22">Chen, Wen-Hwa</searchLink><relatesTo>2</relatesTo>, <i>whchen@pme.nthu.edu.tw</i><br /><searchLink fieldCode="AU" term="%22Lu%2C+Su-Tsai%22">Lu, Su-Tsai</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Lin%2C+Shih-Ming%22">Lin, Shih-Ming</searchLink><relatesTo>3</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Mar2018, Vol. 47 Issue 3, p1832-1846, 15p, 5 Diagrams, 10 Graphs
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=128019711
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        Value: 10.1007/s11664-017-5967-x
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      – Code: eng
        Text: English
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        PageCount: 15
        StartPage: 1832
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      – TitleFull: Assessing Ink Transfer Performance of Gravure-Offset Fine-Line Circuitry Printing.
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            NameFull: Cheng, Hsien-Chie
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            NameFull: Chen, You-Wei
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            NameFull: Chen, Wen-Hwa
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              Text: Mar2018
              Type: published
              Y: 2018
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