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Analysis of Design Parameters Reducing the Damage Rate of Low-Noise Amplifiers Affected by High-Power Electromagnetic Pulses.

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Bibliographic Details
Title: Analysis of Design Parameters Reducing the Damage Rate of Low-Noise Amplifiers Affected by High-Power Electromagnetic Pulses.
Authors: Ji-Eun Baek1, Young-Maan Cho1, Kwang-Cheol Ko1
Source: IEEE Transactions on Plasma Science; Mar2018, Vol. 46 Issue 3, p524-529, 6p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 128682465
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Analysis of Design Parameters Reducing the Damage Rate of Low-Noise Amplifiers Affected by High-Power Electromagnetic Pulses.
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  Data: <searchLink fieldCode="AU" term="%22Ji-Eun+Baek%22">Ji-Eun Baek</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Young-Maan+Cho%22">Young-Maan Cho</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kwang-Cheol+Ko%22">Kwang-Cheol Ko</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Plasma+Science%22">IEEE Transactions on Plasma Science</searchLink>; Mar2018, Vol. 46 Issue 3, p524-529, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=128682465
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TPS.2018.2794973
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 524
    Titles:
      – TitleFull: Analysis of Design Parameters Reducing the Damage Rate of Low-Noise Amplifiers Affected by High-Power Electromagnetic Pulses.
        Type: main
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          Name:
            NameFull: Ji-Eun Baek
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          Name:
            NameFull: Young-Maan Cho
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            NameFull: Kwang-Cheol Ko
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            – D: 01
              M: 03
              Text: Mar2018
              Type: published
              Y: 2018
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              Value: 46
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              Value: 3
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            – TitleFull: IEEE Transactions on Plasma Science
              Type: main
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