APA (7th ed.) Citation

Burkhardt, S., Elm, M. T., Lani‐Wayda, B., & Klar, P. J. (2018). In Situ Monitoring of Lateral Hydrogen Diffusion in Amorphous and Polycrystalline WO3 Thin Films. Advanced Materials Interfaces, 5(6), 1. https://doi.org/10.1002/admi.201701587

Chicago Style (17th ed.) Citation

Burkhardt, Simon, Matthias T. Elm, Bernhard Lani‐Wayda, and Peter J. Klar. "In Situ Monitoring of Lateral Hydrogen Diffusion in Amorphous and Polycrystalline WO3 Thin Films." Advanced Materials Interfaces 5, no. 6 (2018): 1. https://doi.org/10.1002/admi.201701587.

MLA (9th ed.) Citation

Burkhardt, Simon, et al. "In Situ Monitoring of Lateral Hydrogen Diffusion in Amorphous and Polycrystalline WO3 Thin Films." Advanced Materials Interfaces, vol. 5, no. 6, 2018, p. 1, https://doi.org/10.1002/admi.201701587.