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Integrating a Charge Trapping Layer in Passivated Emitter Rear Contact Cell to Enhance Efficiency.

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Title: Integrating a Charge Trapping Layer in Passivated Emitter Rear Contact Cell to Enhance Efficiency.
Authors: Yang, Chih-Cheng, Chiang, Hsiao-Cheng, Chen, Po-Hsun, Su, Yu-Ting, Su, Wan-Ching, Lin, Chun-Chu, Huang, Shin-Ping, Zheng, Hao-Xuan, Huang, Hui-Chun, Chen, Sung-Yu, Lin, Chao-Cheng, Huang, Jen-Wei, Tsai, Tsung-Ming, Chang, Ting-Chang
Source: IEEE Electron Device Letters; Jul2018, Vol. 39 Issue 7, p983-986, 4p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 130410539
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Integrating a Charge Trapping Layer in Passivated Emitter Rear Contact Cell to Enhance Efficiency.
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  Data: <searchLink fieldCode="AU" term="%22Yang%2C+Chih-Cheng%22">Yang, Chih-Cheng</searchLink><br /><searchLink fieldCode="AU" term="%22Chiang%2C+Hsiao-Cheng%22">Chiang, Hsiao-Cheng</searchLink><br /><searchLink fieldCode="AU" term="%22Chen%2C+Po-Hsun%22">Chen, Po-Hsun</searchLink><br /><searchLink fieldCode="AU" term="%22Su%2C+Yu-Ting%22">Su, Yu-Ting</searchLink><br /><searchLink fieldCode="AU" term="%22Su%2C+Wan-Ching%22">Su, Wan-Ching</searchLink><br /><searchLink fieldCode="AU" term="%22Lin%2C+Chun-Chu%22">Lin, Chun-Chu</searchLink><br /><searchLink fieldCode="AU" term="%22Huang%2C+Shin-Ping%22">Huang, Shin-Ping</searchLink><br /><searchLink fieldCode="AU" term="%22Zheng%2C+Hao-Xuan%22">Zheng, Hao-Xuan</searchLink><br /><searchLink fieldCode="AU" term="%22Huang%2C+Hui-Chun%22">Huang, Hui-Chun</searchLink><br /><searchLink fieldCode="AU" term="%22Chen%2C+Sung-Yu%22">Chen, Sung-Yu</searchLink><br /><searchLink fieldCode="AU" term="%22Lin%2C+Chao-Cheng%22">Lin, Chao-Cheng</searchLink><br /><searchLink fieldCode="AU" term="%22Huang%2C+Jen-Wei%22">Huang, Jen-Wei</searchLink><br /><searchLink fieldCode="AU" term="%22Tsai%2C+Tsung-Ming%22">Tsai, Tsung-Ming</searchLink><br /><searchLink fieldCode="AU" term="%22Chang%2C+Ting-Chang%22">Chang, Ting-Chang</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Electron+Device+Letters%22">IEEE Electron Device Letters</searchLink>; Jul2018, Vol. 39 Issue 7, p983-986, 4p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=130410539
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        Value: 10.1109/LED.2018.2841038
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              Text: Jul2018
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