APA (7th ed.) Citation

Wang, P. F., Zhang, E. X., Chuang, K. H., Liao, W., Gong, H., Wang, P., . . . Reed, R. A. (2018). X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices. IEEE Transactions on Nuclear Science, 65(8), 1519. https://doi.org/10.1109/TNS.2017.2789160

Chicago Style (17th ed.) Citation

Wang, P. F., et al. "X-Ray and Proton Radiation Effects on 40 Nm CMOS Physically Unclonable Function Devices." IEEE Transactions on Nuclear Science 65, no. 8 (2018): 1519. https://doi.org/10.1109/TNS.2017.2789160.

MLA (9th ed.) Citation

Wang, P. F., et al. "X-Ray and Proton Radiation Effects on 40 Nm CMOS Physically Unclonable Function Devices." IEEE Transactions on Nuclear Science, vol. 65, no. 8, 2018, p. 1519, https://doi.org/10.1109/TNS.2017.2789160.