X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices.
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| Title: | X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices. |
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| Authors: | Wang, P. F., Zhang, E. X., Chuang, K. H., Liao, W., Gong, H., Wang, P., Arutt, C. N., Ni, K., Mccurdy, M. W., Verbauwhede, I., Bury, E., Linten, D., Fleetwood, D. M., Schrimpf, R. D., Reed, R. A. |
| Source: | IEEE Transactions on Nuclear Science; Aug2018, Vol. 65 Issue 8, p1519-1524, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189499 |
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| DOI: | 10.1109/TNS.2017.2789160 |
