X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices.
Saved in:
| Title: | X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices. |
|---|---|
| Authors: | Wang, P. F., Zhang, E. X., Chuang, K. H., Liao, W., Gong, H., Wang, P., Arutt, C. N., Ni, K., Mccurdy, M. W., Verbauwhede, I., Bury, E., Linten, D., Fleetwood, D. M., Schrimpf, R. D., Reed, R. A. |
| Source: | IEEE Transactions on Nuclear Science; Aug2018, Vol. 65 Issue 8, p1519-1524, 6p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 131346298 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Wang%2C+P%2E+F%2E%22">Wang, P. F.</searchLink><br /><searchLink fieldCode="AU" term="%22Zhang%2C+E%2E+X%2E%22">Zhang, E. X.</searchLink><br /><searchLink fieldCode="AU" term="%22Chuang%2C+K%2E+H%2E%22">Chuang, K. H.</searchLink><br /><searchLink fieldCode="AU" term="%22Liao%2C+W%2E%22">Liao, W.</searchLink><br /><searchLink fieldCode="AU" term="%22Gong%2C+H%2E%22">Gong, H.</searchLink><br /><searchLink fieldCode="AU" term="%22Wang%2C+P%2E%22">Wang, P.</searchLink><br /><searchLink fieldCode="AU" term="%22Arutt%2C+C%2E+N%2E%22">Arutt, C. N.</searchLink><br /><searchLink fieldCode="AU" term="%22Ni%2C+K%2E%22">Ni, K.</searchLink><br /><searchLink fieldCode="AU" term="%22Mccurdy%2C+M%2E+W%2E%22">Mccurdy, M. W.</searchLink><br /><searchLink fieldCode="AU" term="%22Verbauwhede%2C+I%2E%22">Verbauwhede, I.</searchLink><br /><searchLink fieldCode="AU" term="%22Bury%2C+E%2E%22">Bury, E.</searchLink><br /><searchLink fieldCode="AU" term="%22Linten%2C+D%2E%22">Linten, D.</searchLink><br /><searchLink fieldCode="AU" term="%22Fleetwood%2C+D%2E+M%2E%22">Fleetwood, D. M.</searchLink><br /><searchLink fieldCode="AU" term="%22Schrimpf%2C+R%2E+D%2E%22">Schrimpf, R. D.</searchLink><br /><searchLink fieldCode="AU" term="%22Reed%2C+R%2E+A%2E%22">Reed, R. A.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Nuclear+Science%22">IEEE Transactions on Nuclear Science</searchLink>; Aug2018, Vol. 65 Issue 8, p1519-1524, 6p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=131346298 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TNS.2017.2789160 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 1519 Titles: – TitleFull: X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Wang, P. F. – PersonEntity: Name: NameFull: Zhang, E. X. – PersonEntity: Name: NameFull: Chuang, K. H. – PersonEntity: Name: NameFull: Liao, W. – PersonEntity: Name: NameFull: Gong, H. – PersonEntity: Name: NameFull: Wang, P. – PersonEntity: Name: NameFull: Arutt, C. N. – PersonEntity: Name: NameFull: Ni, K. – PersonEntity: Name: NameFull: Mccurdy, M. W. – PersonEntity: Name: NameFull: Verbauwhede, I. – PersonEntity: Name: NameFull: Bury, E. – PersonEntity: Name: NameFull: Linten, D. – PersonEntity: Name: NameFull: Fleetwood, D. M. – PersonEntity: Name: NameFull: Schrimpf, R. D. – PersonEntity: Name: NameFull: Reed, R. A. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 08 Text: Aug2018 Type: published Y: 2018 Identifiers: – Type: issn-print Value: 00189499 Numbering: – Type: volume Value: 65 – Type: issue Value: 8 Titles: – TitleFull: IEEE Transactions on Nuclear Science Type: main |
| ResultId | 1 |