Investigation of Sb65Se35/Sb multilayer thin films for high speed and high thermal stability application in phase change memory.

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Title: Investigation of Sb65Se35/Sb multilayer thin films for high speed and high thermal stability application in phase change memory.
Authors: Guo, Xuan1, Hu, Yifeng1,2,3, hyf@jsut.edu.cn, Chou, Qingqian4, Lai, Tianshu4, stslts@mail.sysu.edu.cn, Zhu, Xiaoqin1
Source: Journal of Materials Science: Materials in Electronics; Oct2018, Vol. 29 Issue 19, p16172-16177, 6p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 131780044
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PubType: Academic Journal
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  Data: Investigation of Sb65Se35/Sb multilayer thin films for high speed and high thermal stability application in phase change memory.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Oct2018, Vol. 29 Issue 19, p16172-16177, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=131780044
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s10854-018-9706-8
    Languages:
      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 16172
    Titles:
      – TitleFull: Investigation of Sb65Se35/Sb multilayer thin films for high speed and high thermal stability application in phase change memory.
        Type: main
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          Name:
            NameFull: Guo, Xuan
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            NameFull: Hu, Yifeng
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            NameFull: Chou, Qingqian
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            NameFull: Lai, Tianshu
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            NameFull: Zhu, Xiaoqin
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          Dates:
            – D: 01
              M: 10
              Text: Oct2018
              Type: published
              Y: 2018
          Identifiers:
            – Type: issn-print
              Value: 09574522
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              Value: 29
            – Type: issue
              Value: 19
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            – TitleFull: Journal of Materials Science: Materials in Electronics
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