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Gain Error Calibrations for Two-Step ADCs: Optimizations Either in Accuracy or Chip Area.

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Bibliographic Details
Title: Gain Error Calibrations for Two-Step ADCs: Optimizations Either in Accuracy or Chip Area.
Authors: Wang, Guan Cheng, Zhu, Yan, Chan, Chi-Hang, U, Seng-Pan, Martins, Rui P.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Nov2018, Vol. 26 Issue 11, p2279-2289, 11p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 132683305
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Gain Error Calibrations for Two-Step ADCs: Optimizations Either in Accuracy or Chip Area.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Wang%2C+Guan+Cheng%22">Wang, Guan Cheng</searchLink><br /><searchLink fieldCode="AU" term="%22Zhu%2C+Yan%22">Zhu, Yan</searchLink><br /><searchLink fieldCode="AU" term="%22Chan%2C+Chi-Hang%22">Chan, Chi-Hang</searchLink><br /><searchLink fieldCode="AU" term="%22U%2C+Seng-Pan%22">U, Seng-Pan</searchLink><br /><searchLink fieldCode="AU" term="%22Martins%2C+Rui+P%2E%22">Martins, Rui P.</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Very+Large+Scale+Integration+%28VLSI%29+Systems%22">IEEE Transactions on Very Large Scale Integration (VLSI) Systems</searchLink>; Nov2018, Vol. 26 Issue 11, p2279-2289, 11p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=132683305
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TVLSI.2018.2865595
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 11
        StartPage: 2279
    Titles:
      – TitleFull: Gain Error Calibrations for Two-Step ADCs: Optimizations Either in Accuracy or Chip Area.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Wang, Guan Cheng
      – PersonEntity:
          Name:
            NameFull: Zhu, Yan
      – PersonEntity:
          Name:
            NameFull: Chan, Chi-Hang
      – PersonEntity:
          Name:
            NameFull: U, Seng-Pan
      – PersonEntity:
          Name:
            NameFull: Martins, Rui P.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 11
              Text: Nov2018
              Type: published
              Y: 2018
          Identifiers:
            – Type: issn-print
              Value: 10638210
          Numbering:
            – Type: volume
              Value: 26
            – Type: issue
              Value: 11
          Titles:
            – TitleFull: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
              Type: main
ResultId 1