High‐Temperature‐Triggered Thermally Degradable Electronics Based on Flexible Silicon Nanomembranes.
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| Title: | High‐Temperature‐Triggered Thermally Degradable Electronics Based on Flexible Silicon Nanomembranes. |
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| Authors: | Li, Gongjin1, Song, Enming1,2, Huang, Gaoshan1, Guo, Qinglei1, Ma, Fei1, Zhou, Bin3, Mei, Yongfeng1, yfm@fudan.edu.cn |
| Source: | Advanced Functional Materials; 11/7/2018, Vol. 28 Issue 45, pN.PAG-N.PAG, 1p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 132852288 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=132852288 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/adfm.201801448 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 1 StartPage: N.PAG Titles: – TitleFull: High‐Temperature‐Triggered Thermally Degradable Electronics Based on Flexible Silicon Nanomembranes. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Li, Gongjin – PersonEntity: Name: NameFull: Song, Enming – PersonEntity: Name: NameFull: Huang, Gaoshan – PersonEntity: Name: NameFull: Guo, Qinglei – PersonEntity: Name: NameFull: Ma, Fei – PersonEntity: Name: NameFull: Zhou, Bin – PersonEntity: Name: NameFull: Mei, Yongfeng IsPartOfRelationships: – BibEntity: Dates: – D: 07 M: 11 Text: 11/7/2018 Type: published Y: 2018 Identifiers: – Type: issn-print Value: 1616301X Numbering: – Type: volume Value: 28 – Type: issue Value: 45 Titles: – TitleFull: Advanced Functional Materials Type: main |
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