APA (7th ed.) Citation

Chang, J., Wu, W., Chang, W., Chen, F., & Tseng, F. (2019). Direct measurement of electrostatic fields within the Zernike electrostatic phase plate using single 155 nm Teflon nanoparticle attached to the pillar-shaped atomic force microscope tip. Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, 37(3), N.PAG. https://doi.org/10.1116/1.5088866

Chicago Style (17th ed.) Citation

Chang, Joe-Ming, Wei-Jung Wu, Wei-Yu Chang, Fu-Rong Chen, and Fan-Gang Tseng. "Direct Measurement of Electrostatic Fields Within the Zernike Electrostatic Phase Plate Using Single 155 nm Teflon Nanoparticle Attached to the Pillar-shaped Atomic Force Microscope Tip." Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics 37, no. 3 (2019): N.PAG. https://doi.org/10.1116/1.5088866.

MLA (9th ed.) Citation

Chang, Joe-Ming, et al. "Direct Measurement of Electrostatic Fields Within the Zernike Electrostatic Phase Plate Using Single 155 nm Teflon Nanoparticle Attached to the Pillar-shaped Atomic Force Microscope Tip." Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, vol. 37, no. 3, 2019, p. N.PAG, https://doi.org/10.1116/1.5088866.