APA (7th ed.) Citation

Zeb, J., Ali, S., Haneef, M., Naeem, A. M., & Akbar, J. (2019). Standardization of proton induced X-ray emission for analysis of trace elements in thick samples. Canadian Journal of Physics, 97(8), 875. https://doi.org/10.1139/cjp-2018-0522

Chicago Style (17th ed.) Citation

Zeb, Johar, Shad Ali, Muhammad Haneef, Azhar Muhammad Naeem, and Jehan Akbar. "Standardization of Proton Induced X-ray Emission for Analysis of Trace Elements in Thick Samples." Canadian Journal of Physics 97, no. 8 (2019): 875. https://doi.org/10.1139/cjp-2018-0522.

MLA (9th ed.) Citation

Zeb, Johar, et al. "Standardization of Proton Induced X-ray Emission for Analysis of Trace Elements in Thick Samples." Canadian Journal of Physics, vol. 97, no. 8, 2019, p. 875, https://doi.org/10.1139/cjp-2018-0522.