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Standardization of proton induced X-ray emission for analysis of trace elements in thick samples.

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Title: Standardization of proton induced X-ray emission for analysis of trace elements in thick samples.
Authors: Zeb, Johar1,2, Ali, Shad1,2,3,4, Haneef, Muhammad1, Naeem, Azhar Muhammad2,3, Akbar, Jehan1,2,4, Jehan@ictp.it
Source: Canadian Journal of Physics; Aug2019, Vol. 97 Issue 8, p875-879, 5p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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  Data: Standardization of proton induced X-ray emission for analysis of trace elements in thick samples.
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  Data: <searchLink fieldCode="JN" term="%22Canadian+Journal+of+Physics%22">Canadian Journal of Physics</searchLink>; Aug2019, Vol. 97 Issue 8, p875-879, 5p
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      – Type: doi
        Value: 10.1139/cjp-2018-0522
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      – Code: eng
        Text: English
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              Text: Aug2019
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              Value: 97
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