Modeling forces between the probe of atomic microscope and the scanning surface.
Saved in:
| Title: | Modeling forces between the probe of atomic microscope and the scanning surface. |
|---|---|
| Authors: | Sharifi, Mohammad Javad1, mjsharifi@ilamcement.com, Khoogar, Ahmad Reza1, Tajdari, Mehdi2 |
| Source: | Neural Computing & Applications; Oct2019, Vol. 31 Issue 10, p6419-6428, 10p |
| Database: | Applied Science & Technology Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
Be the first to leave a comment!