Domino phase retrieval algorithm for structure determination using electron diffraction and high resolution transmission electron microscopy patterns.
Saved in:
| Title: | Domino phase retrieval algorithm for structure determination using electron diffraction and high resolution transmission electron microscopy patterns. |
|---|---|
| Authors: | Chukhovskii, F. N.1, Poliakov, A. M.2, Prokopenko, I. V.3 |
| Source: | Semiconductor Physics, Quantum Electronics & Optoelectronics; 2003, Vol. 6 Issue 3, p397-403, 7p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
|---|---|
| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 13985134 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: Domino phase retrieval algorithm for structure determination using electron diffraction and high resolution transmission electron microscopy patterns. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Chukhovskii%2C+F%2E+N%2E%22">Chukhovskii, F. N.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Poliakov%2C+A%2E+M%2E%22">Poliakov, A. M.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Prokopenko%2C+I%2E+V%2E%22">Prokopenko, I. V.</searchLink><relatesTo>3</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Semiconductor+Physics%2C+Quantum+Electronics+%26+Optoelectronics%22">Semiconductor Physics, Quantum Electronics & Optoelectronics</searchLink>; 2003, Vol. 6 Issue 3, p397-403, 7p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=13985134 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.15407/spqeo6.03.397 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 7 StartPage: 397 Titles: – TitleFull: Domino phase retrieval algorithm for structure determination using electron diffraction and high resolution transmission electron microscopy patterns. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chukhovskii, F. N. – PersonEntity: Name: NameFull: Poliakov, A. M. – PersonEntity: Name: NameFull: Prokopenko, I. V. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: 2003 Type: published Y: 2003 Identifiers: – Type: issn-print Value: 15608034 Numbering: – Type: volume Value: 6 – Type: issue Value: 3 Titles: – TitleFull: Semiconductor Physics, Quantum Electronics & Optoelectronics Type: main |
| ResultId | 1 |