APA (7th ed.) Citation

Ebensperger, N. G., Ferdinand, B., Koelle, D., Kleiner, R., Dressel, M., & Scheffler, M. (2019). Characterizing dielectric properties of ultra-thin films using superconducting coplanar microwave resonators. Review of Scientific Instruments, 90(11), N.PAG. https://doi.org/10.1063/1.5116904

Chicago Style (17th ed.) Citation

Ebensperger, Nikolaj G., Benedikt Ferdinand, Dieter Koelle, Reinhold Kleiner, Martin Dressel, and Marc Scheffler. "Characterizing Dielectric Properties of Ultra-thin Films Using Superconducting Coplanar Microwave Resonators." Review of Scientific Instruments 90, no. 11 (2019): N.PAG. https://doi.org/10.1063/1.5116904.

MLA (9th ed.) Citation

Ebensperger, Nikolaj G., et al. "Characterizing Dielectric Properties of Ultra-thin Films Using Superconducting Coplanar Microwave Resonators." Review of Scientific Instruments, vol. 90, no. 11, 2019, p. N.PAG, https://doi.org/10.1063/1.5116904.