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Characterizing dielectric properties of ultra-thin films using superconducting coplanar microwave resonators.

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Title: Characterizing dielectric properties of ultra-thin films using superconducting coplanar microwave resonators.
Authors: Ebensperger, Nikolaj G.1, Ferdinand, Benedikt2, Koelle, Dieter2, Kleiner, Reinhold2, Dressel, Martin1, Scheffler, Marc1, scheffl@pi1.physik.uni-stuttgart.de
Source: Review of Scientific Instruments; Nov2019, Vol. 90 Issue 11, pN.PAG-N.PAG, 7p, 1 Diagram, 4 Graphs
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 139907540
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="JN" term="%22Review+of+Scientific+Instruments%22">Review of Scientific Instruments</searchLink>; Nov2019, Vol. 90 Issue 11, pN.PAG-N.PAG, 7p, 1 Diagram, 4 Graphs
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        Value: 10.1063/1.5116904
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        Text: English
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      – TitleFull: Characterizing dielectric properties of ultra-thin films using superconducting coplanar microwave resonators.
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              M: 11
              Text: Nov2019
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              Y: 2019
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