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Characterizing dielectric properties of ultra-thin films using superconducting coplanar microwave resonators.

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Bibliographic Details
Title: Characterizing dielectric properties of ultra-thin films using superconducting coplanar microwave resonators.
Authors: Ebensperger, Nikolaj G.1, Ferdinand, Benedikt2, Koelle, Dieter2, Kleiner, Reinhold2, Dressel, Martin1, Scheffler, Marc1, scheffl@pi1.physik.uni-stuttgart.de
Source: Review of Scientific Instruments; Nov2019, Vol. 90 Issue 11, pN.PAG-N.PAG, 7p, 1 Diagram, 4 Graphs
Database: Applied Science & Technology Source
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