Xiang, Z., Wu, Z., Zhang, F., Ji, C., Shi, Y., Dai, J., . . . Jiang, Y. (2020). Effect of low-valence vanadium buffer layer on the properties of vanadium oxide film. Journal of Materials Science: Materials in Electronics, 31(2), 1715. https://doi.org/10.1007/s10854-019-02689-9
Chicago Style (17th ed.) CitationXiang, Zihao, et al. "Effect of Low-valence Vanadium Buffer Layer on the Properties of Vanadium Oxide Film." Journal of Materials Science: Materials in Electronics 31, no. 2 (2020): 1715. https://doi.org/10.1007/s10854-019-02689-9.
MLA (9th ed.) CitationXiang, Zihao, et al. "Effect of Low-valence Vanadium Buffer Layer on the Properties of Vanadium Oxide Film." Journal of Materials Science: Materials in Electronics, vol. 31, no. 2, 2020, p. 1715, https://doi.org/10.1007/s10854-019-02689-9.