Effect of low-valence vanadium buffer layer on the properties of vanadium oxide film.
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| Title: | Effect of low-valence vanadium buffer layer on the properties of vanadium oxide film. |
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| Authors: | Xiang, Zihao1, Wu, Zhiming1, zmwu@uestc.edu.cn, Zhang, Fan1, Ji, Chunhui1, Shi, Yuanlin1, Dai, Jinhong1, Huang, Zhangying1, Xu, Wen1, Dong, Xiang1, dongxiang@uestc.edu.cn, Jiang, Yadong1 |
| Source: | Journal of Materials Science: Materials in Electronics; Jan2020, Vol. 31 Issue 2, p1715-1721, 7p |
| Database: | Applied Science & Technology Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 141319159 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Effect of low-valence vanadium buffer layer on the properties of vanadium oxide film. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Xiang%2C+Zihao%22">Xiang, Zihao</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wu%2C+Zhiming%22">Wu, Zhiming</searchLink><relatesTo>1</relatesTo>, <i>zmwu@uestc.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Fan%22">Zhang, Fan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Ji%2C+Chunhui%22">Ji, Chunhui</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Shi%2C+Yuanlin%22">Shi, Yuanlin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Dai%2C+Jinhong%22">Dai, Jinhong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Huang%2C+Zhangying%22">Huang, Zhangying</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Xu%2C+Wen%22">Xu, Wen</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Dong%2C+Xiang%22">Dong, Xiang</searchLink><relatesTo>1</relatesTo>, <i>dongxiang@uestc.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Jiang%2C+Yadong%22">Jiang, Yadong</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Jan2020, Vol. 31 Issue 2, p1715-1721, 7p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=141319159 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s10854-019-02689-9 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 7 StartPage: 1715 Titles: – TitleFull: Effect of low-valence vanadium buffer layer on the properties of vanadium oxide film. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Xiang, Zihao – PersonEntity: Name: NameFull: Wu, Zhiming – PersonEntity: Name: NameFull: Zhang, Fan – PersonEntity: Name: NameFull: Ji, Chunhui – PersonEntity: Name: NameFull: Shi, Yuanlin – PersonEntity: Name: NameFull: Dai, Jinhong – PersonEntity: Name: NameFull: Huang, Zhangying – PersonEntity: Name: NameFull: Xu, Wen – PersonEntity: Name: NameFull: Dong, Xiang – PersonEntity: Name: NameFull: Jiang, Yadong IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 01 Text: Jan2020 Type: published Y: 2020 Identifiers: – Type: issn-print Value: 09574522 Numbering: – Type: volume Value: 31 – Type: issue Value: 2 Titles: – TitleFull: Journal of Materials Science: Materials in Electronics Type: main |
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