Determination of the full deformation tensor by multi‐Bragg fast scanning nano X‐ray diffraction. - Johannes, Andreas; Rensberg, Jura; Grünewald, Tilman A.; Schöppe, Philipp; Ritzer, Maurizio; Rosenthal, Martin; Ronning, Carsten; Burghammer, Manfred (Journal of Applied Crystallography, 2020)