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Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector.

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Title: Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector.
Authors: Krause, Lennard1, Tolborg, Kasper1, Grønbech, Thomas Bjørn Egede1, Sugimoto, Kunihisa2, Iversen, Bo Brummerstedt1, bo@chem.au.dk, Overgaard, Jacob1, jacobo@chem.au.dk
Source: Journal of Applied Crystallography; Jun2020, Vol. 53 Issue 3, p635-649, 15p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 143570417
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector.
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  Data: <searchLink fieldCode="AU" term="%22Krause%2C+Lennard%22">Krause, Lennard</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Tolborg%2C+Kasper%22">Tolborg, Kasper</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Grønbech%2C+Thomas+Bjørn+Egede%22">Grønbech, Thomas Bjørn Egede</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Sugimoto%2C+Kunihisa%22">Sugimoto, Kunihisa</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Iversen%2C+Bo+Brummerstedt%22">Iversen, Bo Brummerstedt</searchLink><relatesTo>1</relatesTo>, <i>bo@chem.au.dk</i><br /><searchLink fieldCode="AU" term="%22Overgaard%2C+Jacob%22">Overgaard, Jacob</searchLink><relatesTo>1</relatesTo>, <i>jacobo@chem.au.dk</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Crystallography%22">Journal of Applied Crystallography</searchLink>; Jun2020, Vol. 53 Issue 3, p635-649, 15p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=143570417
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1107/S1600576720003775
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 15
        StartPage: 635
    Titles:
      – TitleFull: Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector.
        Type: main
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          Name:
            NameFull: Krause, Lennard
      – PersonEntity:
          Name:
            NameFull: Tolborg, Kasper
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            NameFull: Grønbech, Thomas Bjørn Egede
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            NameFull: Sugimoto, Kunihisa
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            NameFull: Iversen, Bo Brummerstedt
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            NameFull: Overgaard, Jacob
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          Dates:
            – D: 01
              M: 06
              Text: Jun2020
              Type: published
              Y: 2020
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              Value: 00218898
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              Value: 53
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            – TitleFull: Journal of Applied Crystallography
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