Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector. - Krause, Lennard; Tolborg, Kasper; Grønbech, Thomas Bjørn Egede; Sugimoto, Kunihisa; Iversen, Bo Brummerstedt; Overgaard, Jacob (Journal of Applied Crystallography, 2020)