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A 19.5-GHz 28-nm Class-C CMOS VCO, With a Reasonably Rigorous Result on 1/f Noise Upconversion Caused by Short-Channel Effects.

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Title: A 19.5-GHz 28-nm Class-C CMOS VCO, With a Reasonably Rigorous Result on 1/f Noise Upconversion Caused by Short-Channel Effects.
Authors: Franceschin, Alessandro1, alessandro.franceschin@phd.unipd.it, Andreani, Pietro2, pietro.andreani@eit.lth.se, Padovan, Fabio3, Bassi, Matteo3, Bevilacqua, Andrea4
Source: IEEE Journal of Solid-State Circuits; Jul2020, Vol. 55 Issue 7, p1842-1853, 12p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 144343921
AccessLevel: 2
PubType: Academic Journal
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  Data: A 19.5-GHz 28-nm Class-C CMOS VCO, With a Reasonably Rigorous Result on 1/f Noise Upconversion Caused by Short-Channel Effects.
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  Data: <searchLink fieldCode="AU" term="%22Franceschin%2C+Alessandro%22">Franceschin, Alessandro</searchLink><relatesTo>1</relatesTo>, <i>alessandro.franceschin@phd.unipd.it</i><br /><searchLink fieldCode="AU" term="%22Andreani%2C+Pietro%22">Andreani, Pietro</searchLink><relatesTo>2</relatesTo>, <i>pietro.andreani@eit.lth.se</i><br /><searchLink fieldCode="AU" term="%22Padovan%2C+Fabio%22">Padovan, Fabio</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Bassi%2C+Matteo%22">Bassi, Matteo</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Bevilacqua%2C+Andrea%22">Bevilacqua, Andrea</searchLink><relatesTo>4</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Journal+of+Solid-State+Circuits%22">IEEE Journal of Solid-State Circuits</searchLink>; Jul2020, Vol. 55 Issue 7, p1842-1853, 12p
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        Value: 10.1109/JSSC.2020.2987702
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      – Code: eng
        Text: English
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        PageCount: 12
        StartPage: 1842
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      – TitleFull: A 19.5-GHz 28-nm Class-C CMOS VCO, With a Reasonably Rigorous Result on 1/f Noise Upconversion Caused by Short-Channel Effects.
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            NameFull: Padovan, Fabio
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              Text: Jul2020
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              Y: 2020
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