APA (7th ed.) Citation

Edelen, J. P., Cook, N. M., Hall, C. C., Hu, Y., Tan, X., & Vay, J. (2020). Advanced modeling of field enhanced thermionic emission. Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, 38(4), 1. https://doi.org/10.1116/1.5140753

Chicago Style (17th ed.) Citation

Edelen, Jonathan P., Nathan M. Cook, Christopher C. Hall, Yuan Hu, Xi Tan, and Jean-Luc Vay. "Advanced Modeling of Field Enhanced Thermionic Emission." Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics 38, no. 4 (2020): 1. https://doi.org/10.1116/1.5140753.

MLA (9th ed.) Citation

Edelen, Jonathan P., et al. "Advanced Modeling of Field Enhanced Thermionic Emission." Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, vol. 38, no. 4, 2020, p. 1, https://doi.org/10.1116/1.5140753.