Advanced modeling of field enhanced thermionic emission.
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| Title: | Advanced modeling of field enhanced thermionic emission. |
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| Authors: | Edelen, Jonathan P.1, jedelen@radiasoft.net, Cook, Nathan M.1, Hall, Christopher C.1, Hu, Yuan1, Tan, Xi1, Vay, Jean-Luc2 |
| Source: | Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Jul2020, Vol. 38 Issue 4, p1-9, 9p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 144770181 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=144770181 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1116/1.5140753 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 9 StartPage: 1 Titles: – TitleFull: Advanced modeling of field enhanced thermionic emission. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Edelen, Jonathan P. – PersonEntity: Name: NameFull: Cook, Nathan M. – PersonEntity: Name: NameFull: Hall, Christopher C. – PersonEntity: Name: NameFull: Hu, Yuan – PersonEntity: Name: NameFull: Tan, Xi – PersonEntity: Name: NameFull: Vay, Jean-Luc IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: Jul2020 Type: published Y: 2020 Identifiers: – Type: issn-print Value: 21662746 Numbering: – Type: volume Value: 38 – Type: issue Value: 4 Titles: – TitleFull: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics Type: main |
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