APA (7th ed.) Citation

Wang, T., Qiao, M., Zhang, M., Yang, Y., & Snoussi, H. (2020). Data-driven prognostic method based on self-supervised learning approaches for fault detection. Journal of Intelligent Manufacturing, 31(7), 1611. https://doi.org/10.1007/s10845-018-1431-x

Chicago Style (17th ed.) Citation

Wang, Tian, Meina Qiao, Mengyi Zhang, Yi Yang, and Hichem Snoussi. "Data-driven Prognostic Method Based on Self-supervised Learning Approaches for Fault Detection." Journal of Intelligent Manufacturing 31, no. 7 (2020): 1611. https://doi.org/10.1007/s10845-018-1431-x.

MLA (9th ed.) Citation

Wang, Tian, et al. "Data-driven Prognostic Method Based on Self-supervised Learning Approaches for Fault Detection." Journal of Intelligent Manufacturing, vol. 31, no. 7, 2020, p. 1611, https://doi.org/10.1007/s10845-018-1431-x.