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Data-driven prognostic method based on self-supervised learning approaches for fault detection.

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Title: Data-driven prognostic method based on self-supervised learning approaches for fault detection.
Authors: Wang, Tian1, wangtian@buaa.edu.cn, Qiao, Meina1, Zhang, Mengyi2, Yang, Yi3, Snoussi, Hichem4
Source: Journal of Intelligent Manufacturing; Oct2020, Vol. 31 Issue 7, p1611-1619, 9p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 145348412
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PubType: Academic Journal
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  Data: Data-driven prognostic method based on self-supervised learning approaches for fault detection.
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        Value: 10.1007/s10845-018-1431-x
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      – Code: eng
        Text: English
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        PageCount: 9
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              Text: Oct2020
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              Y: 2020
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