Cho, H. W., Lee, I., Lee, H. J., Kim, M. H., Park, J. H., & Oh, Y. R. (2020). 35‐1: The Mechanism and Solution of Horizontal Line Defects by Mutual Interference of Flexible OLED and Touch Sensor. SID Symposium Digest of Technical Papers, 51(1), 489. https://doi.org/10.1002/sdtp.13912
Chicago Style (17th ed.) CitationCho, Hyun Wook, Innam Lee, Hyun Jae Lee, Min Hong Kim, Jae Hyun Park, and Ye Rin Oh. "35‐1: The Mechanism and Solution of Horizontal Line Defects by Mutual Interference of Flexible OLED and Touch Sensor." SID Symposium Digest of Technical Papers 51, no. 1 (2020): 489. https://doi.org/10.1002/sdtp.13912.
MLA (9th ed.) CitationCho, Hyun Wook, et al. "35‐1: The Mechanism and Solution of Horizontal Line Defects by Mutual Interference of Flexible OLED and Touch Sensor." SID Symposium Digest of Technical Papers, vol. 51, no. 1, 2020, p. 489, https://doi.org/10.1002/sdtp.13912.