35‐1: The Mechanism and Solution of Horizontal Line Defects by Mutual Interference of Flexible OLED and Touch Sensor.
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| Title: | 35‐1: The Mechanism and Solution of Horizontal Line Defects by Mutual Interference of Flexible OLED and Touch Sensor. |
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| Authors: | Cho, Hyun Wook1, Lee, Innam1, Lee, Hyun Jae1, Kim, Min Hong1, Park, Jae Hyun1, Oh, Ye Rin1 |
| Source: | SID Symposium Digest of Technical Papers; Aug2020, Vol. 51 Issue 1, p489-492, 4p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 146080223 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=146080223 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/sdtp.13912 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 4 StartPage: 489 Titles: – TitleFull: 35‐1: The Mechanism and Solution of Horizontal Line Defects by Mutual Interference of Flexible OLED and Touch Sensor. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Cho, Hyun Wook – PersonEntity: Name: NameFull: Lee, Innam – PersonEntity: Name: NameFull: Lee, Hyun Jae – PersonEntity: Name: NameFull: Kim, Min Hong – PersonEntity: Name: NameFull: Park, Jae Hyun – PersonEntity: Name: NameFull: Oh, Ye Rin IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 08 Text: Aug2020 Type: published Y: 2020 Identifiers: – Type: issn-print Value: 0097966X Numbering: – Type: volume Value: 51 – Type: issue Value: 1 Titles: – TitleFull: SID Symposium Digest of Technical Papers Type: main |
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