Symalla, F., Fediai, A., Armleder, J., Kaiser, S., Strunk, T., Neumann, T., & Wenzel, W. (2020). 43‐3: Ab‐initio Simulation of Doped Injection Layers. SID Symposium Digest of Technical Papers, 51(1), 630. https://doi.org/10.1002/sdtp.13946
Chicago Style (17th ed.) CitationSymalla, Franz, Artem Fediai, Jonas Armleder, Simon Kaiser, Timo Strunk, Tobias Neumann, and Wolfgang Wenzel. "43‐3: Ab‐initio Simulation of Doped Injection Layers." SID Symposium Digest of Technical Papers 51, no. 1 (2020): 630. https://doi.org/10.1002/sdtp.13946.
MLA (9th ed.) CitationSymalla, Franz, et al. "43‐3: Ab‐initio Simulation of Doped Injection Layers." SID Symposium Digest of Technical Papers, vol. 51, no. 1, 2020, p. 630, https://doi.org/10.1002/sdtp.13946.