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On-Machine Measurement for Surface Flatness of Transparent and Thin Film in Laser Ablation Process.

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Title: On-Machine Measurement for Surface Flatness of Transparent and Thin Film in Laser Ablation Process.
Authors: Kim, HyungTae1, htkim@kitech.re.krmyj3235@kitech.re.kr, Moon, Yoon Jae1, Kang, Heuiseok1, Hwang, Jun Yong1
Source: Coatings (2079-6412); Sep2020, Vol. 10 Issue 9, p885, 1p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 146142470
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: On-Machine Measurement for Surface Flatness of Transparent and Thin Film in Laser Ablation Process.
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  Data: <searchLink fieldCode="JN" term="%22Coatings+%282079-6412%29%22">Coatings (2079-6412)</searchLink>; Sep2020, Vol. 10 Issue 9, p885, 1p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=146142470
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.3390/coatings10090885
    Languages:
      – Code: eng
        Text: English
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        StartPage: 885
    Titles:
      – TitleFull: On-Machine Measurement for Surface Flatness of Transparent and Thin Film in Laser Ablation Process.
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            NameFull: Kim, HyungTae
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            NameFull: Moon, Yoon Jae
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            NameFull: Kang, Heuiseok
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            – D: 01
              M: 09
              Text: Sep2020
              Type: published
              Y: 2020
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              Value: 20796412
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              Value: 10
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              Value: 9
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