Temperature dependence of the electrical characteristics of ZnO thin film transistor with high-k NbLaO gate dielectric.

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Title: Temperature dependence of the electrical characteristics of ZnO thin film transistor with high-k NbLaO gate dielectric.
Authors: Li, Hong-cheng1, Liu, Yu-rong1, phlyr@scut.edu.cn, Geng, Kui-wei1, Wu, Wei-jing2, Yao, Ruo-he1, Lai, Pui-to3, phlyr@scut.edu.cn
Source: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Jan2021, Vol. 39 Issue 1, p1-8, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 148312396
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Temperature dependence of the electrical characteristics of ZnO thin film transistor with high-k NbLaO gate dielectric.
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  Data: <searchLink fieldCode="AU" term="%22Li%2C+Hong-cheng%22">Li, Hong-cheng</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Yu-rong%22">Liu, Yu-rong</searchLink><relatesTo>1</relatesTo>, <i>phlyr@scut.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Geng%2C+Kui-wei%22">Geng, Kui-wei</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wu%2C+Wei-jing%22">Wu, Wei-jing</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Yao%2C+Ruo-he%22">Yao, Ruo-he</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Lai%2C+Pui-to%22">Lai, Pui-to</searchLink><relatesTo>3</relatesTo>, <i>phlyr@scut.edu.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Vacuum+Science+%26+Technology%3A+Part+B-Nanotechnology+%26+Microelectronics%22">Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics</searchLink>; Jan2021, Vol. 39 Issue 1, p1-8, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=148312396
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1116/6.0000522
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 8
        StartPage: 1
    Titles:
      – TitleFull: Temperature dependence of the electrical characteristics of ZnO thin film transistor with high-k NbLaO gate dielectric.
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Li, Hong-cheng
      – PersonEntity:
          Name:
            NameFull: Liu, Yu-rong
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            NameFull: Geng, Kui-wei
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            NameFull: Wu, Wei-jing
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            NameFull: Yao, Ruo-he
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            NameFull: Lai, Pui-to
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          Dates:
            – D: 01
              M: 01
              Text: Jan2021
              Type: published
              Y: 2021
          Identifiers:
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              Value: 21662746
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              Value: 39
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              Value: 1
          Titles:
            – TitleFull: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics
              Type: main
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