Device characteristics of InAlSb/InAs and InAlSb/InAsSb HFETs.
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| Title: | Device characteristics of InAlSb/InAs and InAlSb/InAsSb HFETs. |
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| Authors: | Chen, P.‐Y.1, Gao, Z.‐Y.1, Ho, H.‐C.1, Lin, H.‐K.1, Hsin, Y.‐M.1, yhsin@ee.ncu.edu.tw, Chyi, J.‐I.1 |
| Source: | Electronics Letters (Wiley-Blackwell); Aug2013, Vol. 49 Issue 17, p1026-1028, 3p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 148780143 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=148780143 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1049/el.2013.0788 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 3 StartPage: 1026 Titles: – TitleFull: Device characteristics of InAlSb/InAs and InAlSb/InAsSb HFETs. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chen, P.‐Y. – PersonEntity: Name: NameFull: Gao, Z.‐Y. – PersonEntity: Name: NameFull: Ho, H.‐C. – PersonEntity: Name: NameFull: Lin, H.‐K. – PersonEntity: Name: NameFull: Hsin, Y.‐M. – PersonEntity: Name: NameFull: Chyi, J.‐I. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 08 Text: Aug2013 Type: published Y: 2013 Identifiers: – Type: issn-print Value: 00135194 Numbering: – Type: volume Value: 49 – Type: issue Value: 17 Titles: – TitleFull: Electronics Letters (Wiley-Blackwell) Type: main |
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