Strong Impact of Cr Doping on Structural and Magnetic Properties of Bi0.5La0.5Fe1−xCrxO3−δ.

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Title: Strong Impact of Cr Doping on Structural and Magnetic Properties of Bi0.5La0.5Fe1−xCrxO3−δ.
Authors: Dang, N. T.1,2, dangtoan2107@gmail.com, Rutkaukas, A. V.3, Kichanov, S. E.3, Kozlenko, D. P.3, Nguyen, H. H.4, Tran, N.1,2, tranngo7590@gmail.com, Lee, M. Y.4, Lee, B. W.4, Phan, T. L.4, Khiem, L. H.5,6, Nghia, N. X.5, Thao, L. T. P.7, Tran, T. A.8, Lieu, N. T. T.9, Khan, D. T.7, dtkhan@ued.udn.vn
Source: Journal of Electronic Materials; Mar2021, Vol. 50 Issue 3, p1340-1348, 9p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 148784585
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PubType: Academic Journal
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  Data: Strong Impact of Cr Doping on Structural and Magnetic Properties of Bi0.5La0.5Fe1−xCrxO3−δ.
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  Data: <searchLink fieldCode="AU" term="%22Dang%2C+N%2E+T%2E%22">Dang, N. T.</searchLink><relatesTo>1,2</relatesTo>, <i>dangtoan2107@gmail.com</i><br /><searchLink fieldCode="AU" term="%22Rutkaukas%2C+A%2E+V%2E%22">Rutkaukas, A. V.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Kichanov%2C+S%2E+E%2E%22">Kichanov, S. E.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Kozlenko%2C+D%2E+P%2E%22">Kozlenko, D. P.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Nguyen%2C+H%2E+H%2E%22">Nguyen, H. H.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Tran%2C+N%2E%22">Tran, N.</searchLink><relatesTo>1,2</relatesTo>, <i>tranngo7590@gmail.com</i><br /><searchLink fieldCode="AU" term="%22Lee%2C+M%2E+Y%2E%22">Lee, M. Y.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Lee%2C+B%2E+W%2E%22">Lee, B. W.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Phan%2C+T%2E+L%2E%22">Phan, T. L.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Khiem%2C+L%2E+H%2E%22">Khiem, L. H.</searchLink><relatesTo>5,6</relatesTo><br /><searchLink fieldCode="AU" term="%22Nghia%2C+N%2E+X%2E%22">Nghia, N. X.</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Thao%2C+L%2E+T%2E+P%2E%22">Thao, L. T. P.</searchLink><relatesTo>7</relatesTo><br /><searchLink fieldCode="AU" term="%22Tran%2C+T%2E+A%2E%22">Tran, T. A.</searchLink><relatesTo>8</relatesTo><br /><searchLink fieldCode="AU" term="%22Lieu%2C+N%2E+T%2E+T%2E%22">Lieu, N. T. T.</searchLink><relatesTo>9</relatesTo><br /><searchLink fieldCode="AU" term="%22Khan%2C+D%2E+T%2E%22">Khan, D. T.</searchLink><relatesTo>7</relatesTo>, <i>dtkhan@ued.udn.vn</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Mar2021, Vol. 50 Issue 3, p1340-1348, 9p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=148784585
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        Value: 10.1007/s11664-020-08645-2
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              Text: Mar2021
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