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Calibration and Parameter Extraction of STT-MTJ Device at High Frequency by Using De-Embedding Approach Based on TRL Calibration.

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Title: Calibration and Parameter Extraction of STT-MTJ Device at High Frequency by Using De-Embedding Approach Based on TRL Calibration.
Authors: Liu, Xin1, 6181903008@stu.jiangnan.edu.cn, Xu, Chao1, 6161916016@vip.jiangnan.edu.cn, Yu, Pingping1, pingpingyu@jiangnan.edu.cn, Jiang, Yanfeng1, jiangyf@jiangnan.edu.cn
Source: IEEE Transactions on Electron Devices; Jan2021, Vol. 68 Issue 1, p271-278, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 148948937
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Calibration and Parameter Extraction of STT-MTJ Device at High Frequency by Using De-Embedding Approach Based on TRL Calibration.
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  Data: <searchLink fieldCode="AU" term="%22Liu%2C+Xin%22">Liu, Xin</searchLink><relatesTo>1</relatesTo>, <i>6181903008@stu.jiangnan.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Xu%2C+Chao%22">Xu, Chao</searchLink><relatesTo>1</relatesTo>, <i>6161916016@vip.jiangnan.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Yu%2C+Pingping%22">Yu, Pingping</searchLink><relatesTo>1</relatesTo>, <i>pingpingyu@jiangnan.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Jiang%2C+Yanfeng%22">Jiang, Yanfeng</searchLink><relatesTo>1</relatesTo>, <i>jiangyf@jiangnan.edu.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Electron+Devices%22">IEEE Transactions on Electron Devices</searchLink>; Jan2021, Vol. 68 Issue 1, p271-278, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=148948937
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TED.2020.3039201
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 8
        StartPage: 271
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      – TitleFull: Calibration and Parameter Extraction of STT-MTJ Device at High Frequency by Using De-Embedding Approach Based on TRL Calibration.
        Type: main
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          Name:
            NameFull: Liu, Xin
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          Name:
            NameFull: Xu, Chao
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            NameFull: Yu, Pingping
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            NameFull: Jiang, Yanfeng
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            – D: 01
              M: 01
              Text: Jan2021
              Type: published
              Y: 2021
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              Value: 00189383
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              Value: 68
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              Value: 1
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            – TitleFull: IEEE Transactions on Electron Devices
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