Sun, S., Hu, Y., Lai, T., & Zhu, X. (2021). Effect of Mg35Sb65 interlayer on the thermal stability and scaling of Ge2Sb2Te5 phase change thin film. Journal of Materials Science: Materials in Electronics, 32(5), 6408. https://doi.org/10.1007/s10854-021-05358-y
Chicago Style (17th ed.) CitationSun, Song, Yifeng Hu, Tianshu Lai, and Xiaoqin Zhu. "Effect of Mg35Sb65 Interlayer on the Thermal Stability and Scaling of Ge2Sb2Te5 Phase Change Thin Film." Journal of Materials Science: Materials in Electronics 32, no. 5 (2021): 6408. https://doi.org/10.1007/s10854-021-05358-y.
MLA (9th ed.) CitationSun, Song, et al. "Effect of Mg35Sb65 Interlayer on the Thermal Stability and Scaling of Ge2Sb2Te5 Phase Change Thin Film." Journal of Materials Science: Materials in Electronics, vol. 32, no. 5, 2021, p. 6408, https://doi.org/10.1007/s10854-021-05358-y.