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Effect of Mg35Sb65 interlayer on the thermal stability and scaling of Ge2Sb2Te5 phase change thin film.

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Title: Effect of Mg35Sb65 interlayer on the thermal stability and scaling of Ge2Sb2Te5 phase change thin film.
Authors: Sun, Song1, 1021617629@qq.com, Hu, Yifeng1,2,3, hyf@jsut.edu.cn, Lai, Tianshu4, Zhu, Xiaoqin1
Source: Journal of Materials Science: Materials in Electronics; Mar2021, Vol. 32 Issue 5, p6408-6413, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 149373886
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Effect of Mg35Sb65 interlayer on the thermal stability and scaling of Ge2Sb2Te5 phase change thin film.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Mar2021, Vol. 32 Issue 5, p6408-6413, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=149373886
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1007/s10854-021-05358-y
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 6408
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      – TitleFull: Effect of Mg35Sb65 interlayer on the thermal stability and scaling of Ge2Sb2Te5 phase change thin film.
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            NameFull: Sun, Song
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            NameFull: Hu, Yifeng
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            NameFull: Lai, Tianshu
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            NameFull: Zhu, Xiaoqin
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            – D: 01
              M: 03
              Text: Mar2021
              Type: published
              Y: 2021
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              Value: 09574522
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              Value: 32
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              Value: 5
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            – TitleFull: Journal of Materials Science: Materials in Electronics
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