Post-annealing Effect on Optical and Electronic Properties of Thermally Evaporated MoOX Thin Films as Hole-Selective Contacts for p-Si Solar Cells.

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Title: Post-annealing Effect on Optical and Electronic Properties of Thermally Evaporated MoOX Thin Films as Hole-Selective Contacts for p-Si Solar Cells.
Authors: Jiang, Yuanwei1,2, Cao, Shuangying2,3, Lu, Linfeng2,3, Du, Guanlin2,3, Lin, Yinyue2,3, Wang, Jilei4, Yang, Liyou4, Zhu, Wenqing1, wqzhu@shu.edu.cn, Li, Dongdong2,3, lidd@sari.ac.cn
Source: Nanoscale Research Letters; 5/19/2021, Vol. 16 Issue 1, p1-11, 11p
Database: Applied Science & Technology Source
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  Data: Post-annealing Effect on Optical and Electronic Properties of Thermally Evaporated MoOX Thin Films as Hole-Selective Contacts for p-Si Solar Cells.
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  Data: <searchLink fieldCode="AU" term="%22Jiang%2C+Yuanwei%22">Jiang, Yuanwei</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Cao%2C+Shuangying%22">Cao, Shuangying</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Lu%2C+Linfeng%22">Lu, Linfeng</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Du%2C+Guanlin%22">Du, Guanlin</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Lin%2C+Yinyue%22">Lin, Yinyue</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Jilei%22">Wang, Jilei</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Yang%2C+Liyou%22">Yang, Liyou</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhu%2C+Wenqing%22">Zhu, Wenqing</searchLink><relatesTo>1</relatesTo>, <i>wqzhu@shu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Li%2C+Dongdong%22">Li, Dongdong</searchLink><relatesTo>2,3</relatesTo>, <i>lidd@sari.ac.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22Nanoscale+Research+Letters%22">Nanoscale Research Letters</searchLink>; 5/19/2021, Vol. 16 Issue 1, p1-11, 11p
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        Value: 10.1186/s11671-021-03544-9
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        Text: English
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              Text: 5/19/2021
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