Han-yan, S., Ming-hui, Z., Wei-tao, C., Xiao-peng, C., & Xiao-jian, Y. (2021). 26.4: A Quantitative Method for L0 Light Leakage Sensitivity of TFT‐LCD Based on JND Energy Ratio. SID Symposium Digest of Technical Papers, 52, 360. https://doi.org/10.1002/sdtp.15122
Chicago Style (17th ed.) CitationHan-yan, SUN, ZHANG Ming-hui, CHEN Wei-tao, CUI Xiao-peng, and YANG Xiao-jian. "26.4: A Quantitative Method for L0 Light Leakage Sensitivity of TFT‐LCD Based on JND Energy Ratio." SID Symposium Digest of Technical Papers 52 (2021): 360. https://doi.org/10.1002/sdtp.15122.
MLA (9th ed.) CitationHan-yan, SUN, et al. "26.4: A Quantitative Method for L0 Light Leakage Sensitivity of TFT‐LCD Based on JND Energy Ratio." SID Symposium Digest of Technical Papers, vol. 52, 2021, p. 360, https://doi.org/10.1002/sdtp.15122.