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Three-Dimensional FDTD-Based Simulation of Induced Surges in Secondary Circuits Owing to Primary-Circuit Surges in Substations.

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Title: Three-Dimensional FDTD-Based Simulation of Induced Surges in Secondary Circuits Owing to Primary-Circuit Surges in Substations.
Authors: Tatematsu, Akiyoshi1, akiyoshi@criepi.denken.or.jp, Rachidi, Farhad2, farhad.rachidi@epfl.ch, Rubinstein, Marcos3, marcos.rubinstein@heig-vd.ch
Source: IEEE Transactions on Electromagnetic Compatibility; Aug2021, Vol. 63 Issue 4, p1078-1089, 12p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 153154724
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PubType: Academic Journal
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  Data: Three-Dimensional FDTD-Based Simulation of Induced Surges in Secondary Circuits Owing to Primary-Circuit Surges in Substations.
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  Data: <searchLink fieldCode="AU" term="%22Tatematsu%2C+Akiyoshi%22">Tatematsu, Akiyoshi</searchLink><relatesTo>1</relatesTo>, <i>akiyoshi@criepi.denken.or.jp</i><br /><searchLink fieldCode="AU" term="%22Rachidi%2C+Farhad%22">Rachidi, Farhad</searchLink><relatesTo>2</relatesTo>, <i>farhad.rachidi@epfl.ch</i><br /><searchLink fieldCode="AU" term="%22Rubinstein%2C+Marcos%22">Rubinstein, Marcos</searchLink><relatesTo>3</relatesTo>, <i>marcos.rubinstein@heig-vd.ch</i>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Electromagnetic+Compatibility%22">IEEE Transactions on Electromagnetic Compatibility</searchLink>; Aug2021, Vol. 63 Issue 4, p1078-1089, 12p
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/TEMC.2021.3049144
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      – Code: eng
        Text: English
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        PageCount: 12
        StartPage: 1078
    Titles:
      – TitleFull: Three-Dimensional FDTD-Based Simulation of Induced Surges in Secondary Circuits Owing to Primary-Circuit Surges in Substations.
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            NameFull: Tatematsu, Akiyoshi
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            NameFull: Rachidi, Farhad
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            NameFull: Rubinstein, Marcos
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            – D: 01
              M: 08
              Text: Aug2021
              Type: published
              Y: 2021
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              Value: 63
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              Value: 4
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            – TitleFull: IEEE Transactions on Electromagnetic Compatibility
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