Eismann, J. S., Neugebauer, M., Mantel, K., & Banzer, P. (2021). Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer. Light: Science & Applications, 10(1), 1. https://doi.org/10.1038/s41377-021-00663-x
Chicago Style (17th ed.) CitationEismann, Jörg S., Martin Neugebauer, Klaus Mantel, and Peter Banzer. "Absolute Characterization of High Numerical Aperture Microscope Objectives Utilizing a Dipole Scatterer." Light: Science & Applications 10, no. 1 (2021): 1. https://doi.org/10.1038/s41377-021-00663-x.
MLA (9th ed.) CitationEismann, Jörg S., et al. "Absolute Characterization of High Numerical Aperture Microscope Objectives Utilizing a Dipole Scatterer." Light: Science & Applications, vol. 10, no. 1, 2021, p. 1, https://doi.org/10.1038/s41377-021-00663-x.