APA (7th ed.) Citation

Nguyen, Q., Shikina, T., Teruya, D., Hotta, S., Han, H., & Nakajo, H. (2021). Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning. Applied Sciences (2076-3417), 11(22), 11040. https://doi.org/10.3390/app112211040

Chicago Style (17th ed.) Citation

Nguyen, Quoc, Tomoaki Shikina, Daichi Teruya, Seiji Hotta, Huy-Dung Han, and Hironori Nakajo. "Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning." Applied Sciences (2076-3417) 11, no. 22 (2021): 11040. https://doi.org/10.3390/app112211040.

MLA (9th ed.) Citation

Nguyen, Quoc, et al. "Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning." Applied Sciences (2076-3417), vol. 11, no. 22, 2021, p. 11040, https://doi.org/10.3390/app112211040.