APA (7th ed.) Citation

Iheomamere, C. E., Arnold, C. L., Summers, J., Reidy, R. F., Voevodin, A. A., & Shepherd, N. D. (2022). Characterization of RF magnetron-sputtered a-BOxNy/ZnO MIS structures for transparent electronics. Journal of Materials Science: Materials in Electronics, 33(2), 974. https://doi.org/10.1007/s10854-021-07368-2

Chicago Style (17th ed.) Citation

Iheomamere, Chukwudi E., Corey L. Arnold, Jason Summers, Richard F. Reidy, Andrey A. Voevodin, and Nigel D. Shepherd. "Characterization of RF Magnetron-sputtered A-BOxNy/ZnO MIS Structures for Transparent Electronics." Journal of Materials Science: Materials in Electronics 33, no. 2 (2022): 974. https://doi.org/10.1007/s10854-021-07368-2.

MLA (9th ed.) Citation

Iheomamere, Chukwudi E., et al. "Characterization of RF Magnetron-sputtered A-BOxNy/ZnO MIS Structures for Transparent Electronics." Journal of Materials Science: Materials in Electronics, vol. 33, no. 2, 2022, p. 974, https://doi.org/10.1007/s10854-021-07368-2.