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Thermal Effects on Initial Volatile Response and Relaxation Dynamics of Resistive RAM Devices.

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Title: Thermal Effects on Initial Volatile Response and Relaxation Dynamics of Resistive RAM Devices.
Authors: Abbey, Thomas1, ta5g14@ecs.soton.ac.uk, Giotis, Christos1, c.giotis@soton.ac.uk, Serb, Alex1, a.serb@soton.ac.uk, Stathopoulos, Spyros1, s.stathopoulos@soton.ac.uk, Prodromakis, Themis1, t.prodromakis@soton.ac.uk
Source: IEEE Electron Device Letters; Mar2022, Vol. 43 Issue 3, p386-389, 4p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 155494706
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Thermal Effects on Initial Volatile Response and Relaxation Dynamics of Resistive RAM Devices.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Abbey%2C+Thomas%22">Abbey, Thomas</searchLink><relatesTo>1</relatesTo>, <i>ta5g14@ecs.soton.ac.uk</i><br /><searchLink fieldCode="AU" term="%22Giotis%2C+Christos%22">Giotis, Christos</searchLink><relatesTo>1</relatesTo>, <i>c.giotis@soton.ac.uk</i><br /><searchLink fieldCode="AU" term="%22Serb%2C+Alex%22">Serb, Alex</searchLink><relatesTo>1</relatesTo>, <i>a.serb@soton.ac.uk</i><br /><searchLink fieldCode="AU" term="%22Stathopoulos%2C+Spyros%22">Stathopoulos, Spyros</searchLink><relatesTo>1</relatesTo>, <i>s.stathopoulos@soton.ac.uk</i><br /><searchLink fieldCode="AU" term="%22Prodromakis%2C+Themis%22">Prodromakis, Themis</searchLink><relatesTo>1</relatesTo>, <i>t.prodromakis@soton.ac.uk</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Electron+Device+Letters%22">IEEE Electron Device Letters</searchLink>; Mar2022, Vol. 43 Issue 3, p386-389, 4p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=155494706
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/LED.2022.3145620
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 4
        StartPage: 386
    Titles:
      – TitleFull: Thermal Effects on Initial Volatile Response and Relaxation Dynamics of Resistive RAM Devices.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Abbey, Thomas
      – PersonEntity:
          Name:
            NameFull: Giotis, Christos
      – PersonEntity:
          Name:
            NameFull: Serb, Alex
      – PersonEntity:
          Name:
            NameFull: Stathopoulos, Spyros
      – PersonEntity:
          Name:
            NameFull: Prodromakis, Themis
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 03
              Text: Mar2022
              Type: published
              Y: 2022
          Identifiers:
            – Type: issn-print
              Value: 07413106
          Numbering:
            – Type: volume
              Value: 43
            – Type: issue
              Value: 3
          Titles:
            – TitleFull: IEEE Electron Device Letters
              Type: main
ResultId 1