APA (7th ed.) Citation

Schlosser, T., Friedrich, M., Beuth, F., & Kowerko, D. (2022). Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks. Journal of Intelligent Manufacturing, 33(4), 1099. https://doi.org/10.1007/s10845-021-01906-9

Chicago Style (17th ed.) Citation

Schlosser, Tobias, Michael Friedrich, Frederik Beuth, and Danny Kowerko. "Improving Automated Visual Fault Inspection for Semiconductor Manufacturing Using a Hybrid Multistage System of Deep Neural Networks." Journal of Intelligent Manufacturing 33, no. 4 (2022): 1099. https://doi.org/10.1007/s10845-021-01906-9.

MLA (9th ed.) Citation

Schlosser, Tobias, et al. "Improving Automated Visual Fault Inspection for Semiconductor Manufacturing Using a Hybrid Multistage System of Deep Neural Networks." Journal of Intelligent Manufacturing, vol. 33, no. 4, 2022, p. 1099, https://doi.org/10.1007/s10845-021-01906-9.